Avner Safrani

7 Patents

• US125298782026

  High Contrast Imaging in Bonded Sample Metrology Using Oblique Illumination

  KLA Corporation

  0 cites
• US123723452025

  3D Profilometry with a Linnik Interferometer

  KLA Corporation

  0 cites
• US120663222024

  Single Grab Overlay Measurement of Tall Targets

  KLA Corporation

  0 cites
• US119218252024

  System and Method for Determining Target Feature Focus in Image-based Overlay Metrology

  KLA Corporation

  0 cites
• US119087222024

  Automatic Teaching of Substrate Handling for Production and Process-control Tools

  KLA Corporation

  0 cites
• US117748662023

  Active Reticle Carrier for in Situ Stage Correction

  KLA Corporation

  0 cites
• US115567382023

  System and Method for Determining Target Feature Focus in Image-based Overlay Metrology

  KLA Corporation

  0 cites