Patents/Inventors

Avneep Kumar Goyal

Greater NoidaIN12 patents

11 Patents

US125855302026
Single Signal Debug Port
Stmicroelectronics International N.V.
0 cites
US125807902026
Controller Area Network Extra-long (CAN-XL) Low Latency Hardware and Software Partitioned Architecture for Message Handler
STMICROELECTRONICS INTERNATIONAL N.V.
0 cites
US123935052025
Reset Circuitry Providing Independent Reset Signal for Trace and Debug Logic
Stmicroelectronics International N.V.
0 cites
US122988722025
Glitch Suppression Apparatus and Method
Stmicroelectronics International N.V.
0 cites
US122724162025
ATPG Testing Method for Latch Based Memories, for Area Reduction
Stmicroelectronics International N.V.
0 cites
US122106092025
Central Controller for Multiple Development Ports
Stmicroelectronics International N.V.
0 cites
US120207602024
ATPG Testing Method for Latch Based Memories, for Area Reduction
Stmicroelectronics International N.V.
0 cites
US119144992024
Systems and Methods for Preparing Trace Data
Stmicroelectronics International N.V.
0 cites
US118925052024
Debug and Trace Circuit in Lockstep Architectures, Associated Method, Processing System, and Apparatus
Stmicroelectronics International N.V.
0 cites
US116874282023
Glitch Suppression Apparatus and Method
Stmicroelectronics International N.V.
0 cites
US115573642023
ATPG Testing Method for Latch Based Memories, for Area Reduction
Stmicroelectronics International N.V.
0 cites