Patents/Inventors

Avi Abramov

HaifaIL3 patents

4 Patents

US121115802024
Optical Metrology Utilizing Short-wave Infrared Wavelengths
KLA Corporation
0 cites
US120011482024
Enhancing Performance of Overlay Metrology
KLA Corporation
0 cites
US116625622023
Broadband Illumination Tuning
KLA Corporation
0 cites
US115927552023
Enhancing Performance of Overlay Metrology
KLA Corporation
0 cites