Arvind Jayaraman

4 Patents

• US125435402026

  High Resolution Profile Measurement Based on a Trained Parameter Conditioned Measurement Model

  KLA Corporation

  0 cites
• US125357442026

  Overlay Estimation Based on Optical Inspection and Machine Learning

  KLA Corporation

  0 cites
• US124438402025

  Dynamic Control of Machine Learning Based Measurement Recipe Optimization

  KLA Corporation

  0 cites
• US119827472024

  Systems and Methods for Generating Synthetic Sensor Data

  The Mathworks, Inc.

  0 cites