7 Patents
- US121967812025Probes with Planar Unbiased Spring Elements for Electronic Component Contact, Methods for Making Such Probes, and Methods for Using Such Probes
Microfabrica Inc.
0 cites - US121967822025Probes with Planar Unbiased Spring Elements for Electronic Component Contact, Methods for Making Such Probes, and Methods for Using Such Probes
Microfabrica Inc.
0 cites - US121468982024Multi-beam Probes with Decoupled Structural and Current Carrying Beams and Methods of Making
Microfabrica Inc.
0 cites - US120786572024Compliant Pin Probes with Extension Springs, Methods for Making, and Methods for Using
Microfabrica Inc.
0 cites - US120664622024Probes with Planar Unbiased Spring Elements for Electronic Component Contact and Methods for Making Such Probes
Microfabrica Inc.
0 cites - 0 cites
- US117619822023Probes with Planar Unbiased Spring Elements for Electronic Component Contact and Methods for Making Such Probes
Microfabrica Inc.
0 cites