4 Patents
- 0 cites
- US121425532024Guard Ring Design Enabling In-line Testing of Silicon Bridges for Semiconductor Packages
Intel Corporation
0 cites - US117282582023Electroless Metal-defined Thin Pad First Level Interconnects for Lithographically Defined Vias
Intel Corporation
0 cites - US116768892023Guard Ring Design Enabling In-line Testing of Silicon Bridges for Semiconductor Packages
Intel Corporation
0 cites