Armand Eugene Albert Koolen

5 Patents

• US124364702025

  Substrate Comprising a Target Arrangement, and Associated at Least One Patterning Device, Lithographic Method and Metrology Method

  ASML Netherlands B.V.

  0 cites
• US124055352025

  Method for Filtering an Image and Associated Metrology Apparatus

  ASML Netherlands B.V.

  0 cites
• US123668112025

  Metrology System and Method for Determining a Characteristic of One or More Structures on a Substrate

  ASML Netherlands B.V.

  0 cites
• US122769212025

  Substrate Comprising a Target Arrangement, and Associated at Least One Patterning Device, Lithographic Method and Metrology Method

  ASML Netherlands B.V.

  0 cites
• US120077002024

  Metrology System and Method for Determining a Characteristic of One or More Structures on a Substrate

  ASML Netherlands B.V.

  0 cites