3 Patents
- US122351922025Methods and Systems for Estimating Damage Risk Due to Drop of an Electronic Device
SAMSUNG ELECTRONICS CO., Ltd.
0 cites - US119190062024Method for Poc-based Detection of Pathogenic Infection via Nucleic Acid Based Testing
INDIAN INSTITUTE OF TECHNOLOGY, KHARAGPUR
0 cites - US119117702024Point of Care (POC) Device for Facilitating Nucleic Acid Based Testing and Method Thereof
INDIAN INSTITUTE OF TECHNOLOGY, KHARAGPUR
0 cites