Patents/Inventors

Ariel Shkalim

DN Sede-GatIL3 patents

4 Patents

US124003142025
Mask Inspection for Semiconductor Specimen Fabrication
Applied Materials Israel Ltd.
0 cites
US123615352025
Mask Inspection for Semiconductor Specimen Fabrication
Applied Materials Israel Ltd.
0 cites
US119838672024
Mask Inspection of a Semiconductor Specimen
Applied Materials Israel Ltd.
0 cites
US117561882023
Determining a Critical Dimension Variation of a Pattern
Applied Materials Israel Ltd.
0 cites