Patents/Inventors

Ariel Hildesheim

Milpitas, CAUS7 patents

3 Patents

US126191622026
Extra Tall Target Metrology
KLA Corporation
0 cites
US121115802024
Optical Metrology Utilizing Short-wave Infrared Wavelengths
KLA Corporation
0 cites
US116370302023
Multi-stage, Multi-zone Substrate Positioning Systems
KLA Corporation
0 cites