Patents/Inventors

Ariel Broitman

RehovotIL2 patents

3 Patents

US122363642025
Metrology and Process Control for Semiconductor Manufacturing
NOVA Ltd
0 cites
US120382712024
Detecting Outliers and Anomalies for OCD Metrology Machine Learning
NOVA Ltd
0 cites
US117631812023
Metrology and Process Control for Semiconductor Manufacturing
NOVA Ltd
0 cites