Apik A. Zorian

2 Patents

• US123332272025

  Machine-learning-based Design-for-test (DFT) Recommendation System for Improving Automatic Test Pattern Generation (ATPG) Quality of Results (qor)

  SYNOPSYS, Inc.

  0 cites
• US118296922023

  Machine-learning-based Design-for-test (DFT) Recommendation System for Improving Automatic Test Pattern Generation (ATPG) Quality of Results (QOR)

  Synopsys, Inc.

  0 cites