Anurag Jindal

4 Patents

• US122657762025

  Identifying Test Coverage Gaps for Integrated Circuit Designs Based on Node Testability and Physical Design Data

  NXP USA, Inc.

  0 cites
• US122372172025

  Methods of Exposing Conductive Vias of Semiconductor Devices and Related Semiconductor Devices

  Micron Technology, Inc.

  0 cites
• US118219462023

  Built in Self Test (BIST) for Clock Generation Circuitry

  NXP USA, Inc.

  0 cites
• US117422822023

  Conductive Interconnects

  Micron Technology, Inc.

  0 cites