4 Patents
- US122050612025Shared Data Induced Quality Control for a Chemical Mechanical Planarization Process
Versum Materials US, LLC
0 cites - US121632242024Methods for Depositing a Conformal Metal or Metalloid Silicon Nitride Film
BOARD OF REGENTS, THE UNIVERSITY OF TEXAS SYSTEM
0 cites - US117422002023Composition and Methods Using Same for Carbon Doped Silicon Containing Films
VERSUM MATERIALS US, LLC
0 cites - 0 cites