Anuj Doshi

3 Patents

• US123873172025

  Artificial Intelligence Process Control for Assembly Processes

  Nanotronics Imaging, Inc.

  0 cites
• US122432932025

  System and Method for Generating Training Data Sets for Specimen Defect Detection

  Nanotronics Imaging, Inc.

  0 cites
• US117276722023

  System and Method for Generating Training Data Sets for Specimen Defect Detection

  Nanotronics Imaging, Inc.

  0 cites