6 Patents
- US121406322024Device Under Test Synchronization with Automated Test Equipment Check Cycle
Synopsys, Inc.
0 cites - 0 cites
- US119211602024Using Scan Chains to Read Out Data from Integrated Sensors During Scan Tests
Synopsys, Inc.
0 cites - US118607512024Deterministic Data Latency in Serializer/deserializer-based Design for Test Systems
Synopsys, Inc.
0 cites - 0 cites
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