Patents/Inventors

Anton Medvedev

Suwon-siKR2 patents

2 Patents

US125387582026
Substrate Inspection System and Method of Manufacturing Semiconductor Device Using Substrate Inspection System
Samsung Electronics Co., Ltd.
0 cites
US118239612023
Substrate Inspection System and Method of Manufacturing Semiconductor Device Using Substrate Inspection System
SAMSUNG ELECTRONICS CO., Ltd.
0 cites