Antoine Gaston Marie Kiers

3 Patents

• US123151752025

  Method in the Manufacturing Process of a Device, a Non-transitory Computer-readable Medium and a System Configured to Perform the Method

  ASML NETHERLANDS B.V.

  0 cites
• US119661682024

  Method of Measuring Variation, Inspection System, Computer Program, and Computer System

  ASML NETHERLANDS B.V.

  0 cites
• US118475702023

  Deep Learning for Semantic Segmentation of Pattern

  ASML NETHERLANDS B.V.

  0 cites