Patents/Inventors

Ankush Bharati Oberai

Fremont, CAUS4 patents

3 Patents

US125796372026
Creating Scanning Plans for Improving Accuracy and Resolution of Optical Wafer Inspection
SYNOPSYS, Inc.
0 cites
US117630592023
Net-based Wafer Inspection
Synopsys, Inc.
0 cites
US115612562023
Correlation Between Emission Spots Utilizing CAD Data in Combination with Emission Microscope Images
Synopsys, Inc.
0 cites