Patents/Inventors

Ankur Pariyani

Philadelphia, PAUS1 patent

2 Patents

US124932742025
Dynamic Prediction of Risk Levels for Manufacturing Operations Through Leading Risk Indicators: Dynamic Risk Pattern Match Method and System
Near-miss Management, LLC
0 cites
US118530532023
Dynamic Prediction of Risk Levels for Manufacturing Operations Through Leading Risk Indicators: Dynamic Exceedance Probability Method and System
Near-miss Management LLC
0 cites