Patents/Inventors

Angel Alberich Bayarri

ValenciaES1 patent

2 Patents

US121594452024
Method and System for Identifying Anomalies in X-rays
QUIBIM, S.L.
0 cites
US119154202024
Method for Obtaining an Image Biomarker That Quantifies the Quality of the Trabecular Structure of Bones
UNIVERSIDAD DE ZARAGOZA
0 cites