Andries Pieter Johan Effting

3 Patents

• US123879052025

  Apparatus and Method for Detecting One or More Scanning Charged Particle Beams

  DELMIC IP B.V.

  0 cites
• US123061212025

  Method and Apparatus for Inspecting a Sample by Means of Multiple Charged Particle Beamlets

  DELMIC IP B.V.

  0 cites
• US121238412024

  Apparatus and Method for Projecting an Array of Multiple Charged Particle Beamlets on a Sample

  DELMIC IP B.V.

  0 cites