14 Patents
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- US122886922025Method of Forming a FET Structure by Selective Deposition of Film on Source/drain Contact
TOKYO ELECTRON LIMITED
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- US120805992024Methods for Forming Self-aligned Contacts Using Spin-on Silicon Carbide
Tokyo Electron Limited
0 cites - US120401762024Technologies for High Aspect Ratio Carbon Etching with Inserted Charge Dissipation Layer
Tokyo Electron Limited
0 cites - US119786312024Forming Contact Holes with Controlled Local Critical Dimension Uniformity
Tokyo Electron Limited
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- US116519672023Non-atomic Layer Deposition (ALD) Method of Forming Sidewall Passivation Layer During High Aspect Ratio Carbon Layer Etch
Tokyo Electron Limited
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