9 Patents
- US124808892025Inspection Recipe Optimization for Semiconductor Specimens
Applied Materials Israel Ltd.
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- US119403902024Selecting a Representative Subset of Potential Defects to Improve Defect Classifier Training and Estimation of Expected Defects of Interest
Applied Materials Israel Ltd.
0 cites - US117762432023Systems and Methods for Automated Detection of Visual Objects in Medical Images
Nano-x AI Ltd.
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