Patents/Inventors

Ali Hadjikhani

Farmington, CTUS1 patent

2 Patents

US120273432024
Real-time Direct Measurement of Mechanical Properties In-situ of Scanning Beam Microscope
University Of Connecticut
0 cites
US115574562023
Real-time Direct Measurement of Mechanical Properties In-situ of Scanning Beam Microscope
University Of Connecticut
0 cites