3 Patents
- US121425362024Method of Detecting a Possible Thinning of a Substrate of an Integrated Circuit via the Rear Face Thereof, and Associated Device
Stmicroelectronics (Rousset) SAS
0 cites - US119424402024Method for Detecting a Differential Fault Analysis Attack and a Thinning of the Substrate in an Integrated Circuit, and Associated Integrated Circuit
Stmicroelectronics (Rousset) SAS
0 cites - US115629332023Method of Detecting a Possible Thinning of a Substrate of an Integrated Circuit via the Rear Face Thereof, and Associated Device
Stmicroelectronics (Rousset) SAS
0 cites