19 Patents
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- US123555022025Measurement Application Device Calibration Unit, Measurement System, Method
Rohde & Schwarz GmbH & Co. KG
0 cites - US123302432025Method of Forming an Intermetallic Phase Layer with a Plurality of Nickel Particles
Infineon Technologies AG
0 cites - US123349892025Radio Frequency Testing Apparatus with Voltage Standing Wave Ratio Adjustment and Corresponding Method
Rohde & Schwarz GmbH & Co. KG
0 cites - US122773602025Method and Monitoring System for Providing Signal Level Performance Information
Rohde & Schwarz GmbH & Co. KG
0 cites - US122352992025Measurement System and Method of Determining a Corrected Averaged Power Signal
Rohde & Schwarz GmbH & Co. KG
0 cites - US122372422025Semiconductor Device Package Comprising a Thermal Interface Material with Improved Handling Properties
Infineon Technologies Austria AG
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- US121192842024DBC Substrate for Power Semiconductor Devices, Method for Fabricating a DBC Substrate and Power Semiconductor Device Having a DBC Substrate
Infineon Technologies Austria AG
0 cites - US120698022024Pre-plating of Solder Layer on Solderable Elements for Diffusion Soldering
Infineon Technologies AG
0 cites - US120237622024Layer Structure with an Intermetallic Phase Layer and a Chip Package That Includes the Layer Structure
Infineon Technologies AG
0 cites - US120281172024Method as Well as Test System for Testing a Device Under Test
ROHDE & SCHWARZ GmbH & Co. KG
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- US118043832023Method for Producing a Metal-ceramic Substrate with Electrically Conductive Vias
Infineon Technologies AG
0 cites - US116263512023Semiconductor Package with Barrier to Contain Thermal Interface Material
Infineon Technologies AG
0 cites - 0 cites
- US115574902023Method for Producing a Metal-ceramic Substrate with at Least One Via
Infineon Technologies AG
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