Patents/Inventors

Alexander Krokhmal

HaifaIL4 patents

5 Patents

US122490592025
Navigation Accuracy Using Camera Coupled with Detector Assembly
Bruker Technologies Ltd.
0 cites
US120855212024
Small-angle X-ray Scatterometry
BRUKER TECHNOLOGIES Ltd.
0 cites
US120786042024
Monitoring Properties of X-ray Beam During X-ray Analysis
BRUKER TECHNOLOGIES Ltd.
0 cites
US117819992023
Spot-size Control in Reflection-based and Scatterometry-based X-ray Metrology Systems
BRUKER TECHNOLOGIES Ltd.
0 cites
US117034642023
Small-angle X-ray Scatterometry
BRUKER TECHNOLOGIES Ltd.
0 cites