Patents/Inventors

Alexander Henstra

EindhovenNL13 patents

12 Patents

US125975832026
FIB and SEM Resolution Enhancement Using Asymmetric Probe Deconvolution
FEI Company
0 cites
US125059752025
Focused Ion Beam System and Method
FEI Company
0 cites
US125059962025
EELS Auto-alignment Using Full Image Simulation
FEI Company
0 cites
US123945872025
Simple Spherical Aberration Corrector for SEM
FEI Company
0 cites
US123621322025
Simple Spherical Aberration Corrector for SEM
FEI Company
0 cites
US122160682025
Bifocal Electron Microscope
FEI Company
0 cites
US121005852024
Energy Spectrometer with Dynamic Focus
FEI Company
0 cites
US119159042024
Reduction of Thermal Magnetic Field Noise in TEM Corrector Systems
FEI COMPANY
0 cites
US119064502024
Electron Diffraction Holography
FEI Company
0 cites
US118154762023
Methods and Systems for Acquiring Three-dimensional Electron Diffraction Data
FEI Company
0 cites
US118043572023
Electron Optical Module for Providing an Off-axial Electron Beam with a Tunable Coma
FEI Company
0 cites
US117156182023
System and Method for Reducing the Charging Effect in a Transmission Electron Microscope System
FEI Company
0 cites