Alexander Hendrik Vincent Van Veen

5 Patents

• US123879032025

  Aberration Correction in Charged Particle System

  ASML Netherlands B.V.

  0 cites
• US123277072025

  Charged Particle Blocking Element, Exposure Apparatus Comprising Such an Element, and Method for Using Such an Exposure Apparatus

  ASML Netherlands B.V.

  0 cites
• US119616272024

  Vacuum Chamber Arrangement for Charged Particle Beam Generator

  ASML Netherlands B.V.

  0 cites
• US117281232023

  Charged Particle Blocking Element, Exposure Apparatus Comprising Such an Element, and Method for Using Such an Exposure Apparatus

  ASML Netherlands B.V.

  0 cites
• US117052522023

  Vacuum Chamber Arrangement for Charged Particle Beam Generator

  ASML Netherlands B.V.

  0 cites