5 Patents
- US122480122025Method for Producing a Probe Used for Testing Integrated Electronic Circuits
Stmicroelectronics S.r.l.
0 cites - 0 cites
- US117965682023Method for Manufacturing Probes for Testing Integrated Electronic Circuits
Stmicroelectronics S.r.l.
0 cites - US117249322023Integrated Micro-electromechanical Device of Semiconductor Material Having a Diaphragm
Stmicroelectronics S.r.l.
0 cites - US115521912023Power Device, System Including the Power Device, Method for Manufacturing the Power Device, and Method for Controlling the Power Device
STMICROELECTRONICS S.r.l.
0 cites