Albert Barrett Hicks, III

4 Patents

• US125688002026

  Chemical-dose Substrate Deposition Monitoring

  Applied Materials, Inc.

  0 cites
• US123337002025

  Chemical-dose Substrate Deposition Monitoring

  Applied Materials, Inc.

  0 cites
• US117027442023

  Metal Oxyfluoride Film Formation Methods

  Applied Materials, Inc.

  0 cites
• US115812062023

  Capacitive Sensor for Chamber Condition Monitoring

  Applied Materials, Inc.

  0 cites