Alain Courteville

7 Patents

• US124440392025

  Method and a System for Characterising Structures Through a Substrate

  UNITY SEMICONDUCTOR

  0 cites
• US123599102025

  Device and Method for Measuring Interfaces of an Optical Element

  FOGALE NANOTECH

  0 cites
• US121637772024

  Device and Method for Imaging and Interferometry Measurements

  FOGALE NANOTECH

  0 cites
• US121236982024

  Method and a System for Characterizing Structures Through a Substrate

  UNITY SEMICONDUCTOR

  0 cites
• US120799792024

  Method and a System for Characterising Structures Through a Substrate

  UNITY SEMICONDUCTOR

  0 cites
• US118086562023

  Device and Method for Measuring Interfaces of an Optical Element

  FOGALE NANOTECH

  0 cites
• US117312852023

  Apparatus Provided with a Capacitive Detection and Electric Line(s) in the Capacitive Detection Zone

  FOGALE SENSORS

  0 cites