Patents/Inventors

Akira Tsuji

TokyoJP20 patents

18 Patents

US125717002026
Abnormality Detection System, Abnormality Detection Method, and Computer Readable Medium
NEC CORPORATION
0 cites
US125732752026
Abnormality Determination Method, Abnormality Determination Apparatus, Abnormality Determination System, and Non-transitory Computer-readable Medium
NEC CORPORATION
0 cites
US124495422025
Measurement Apparatus, Information Processing Apparatus, Data Specifying Method, and Non-transitory Computer-readable Medium
NEC CORPORATION
0 cites
US123723512025
Abnormality Detection System, Abnormality Detection Method, and Computer Readable Medium
NEC CORPORATION
0 cites
US123599082025
Member Distinguish Apparatus, Member Distinguish Method, and Computer-readable Medium
NEC CORPORATION
0 cites
US123528592025
Position Management Device, Position Management System, Position Management Method and Non-transitory Computer-readable Medium Having Program Stored Thereon
NEC CORPORATION
0 cites
US123458202025
Measurement Control Apparatus, Measurement System, Measurement Control Method, and Non-transitory Computer Readable Medium
NEC CORPORATION
0 cites
US123393672025
Detection Device, Determination Method, and Non-transitory Computer-readable Medium
NEC CORPORATION
0 cites
US122707662025
Inspection Support Apparatus, Inspection Support Method, and Computer-readable Medium
NEC CORPORATION
0 cites
US122222932025
Detection Device, Label Assignment Method, and Non-transitory Computer-readable Medium
NEC CORPORATION
0 cites
US122236342025
Inspection Apparatus, Measuring Method, and Computer Readable Medium for Acquiring Point Cloud Data of Good Quality in Performing Measurement of a Member to Be Inspected Using a Three-dimensional Sensor
NEC Corporation
0 cites
US122174822025
Processing Apparatus, Processing Method, and Computer Readable Medium
NEC CORPORATION
0 cites
US122040302025
Detection Apparatus, Determination Method, and Non-transitory Computer Readable Medium Storing Program
NEC CORPORATION
0 cites
US121755932024
Display Device, Display Method, and Non-transitory Computer-readable Medium Having Program Stored Therein
NEC CORPORATION
0 cites
US121542582024
Surface Abnormality Detection Device and System
NEC CORPORATION
0 cites
US121469592024
Monitoring Control Device, Monitoring System, Monitoring Control Method, and Non-transitory Computer-readable Medium with Program Stored Therein
NEC CORPORATION
0 cites
US118691792024
Abnormal Part Display Apparatus, Abnormal Part Display System, Abnormal Part Display Method, and Abnormal Part Display Program
NEC CORPORATION
0 cites
US115612832023
Distance Measurement Apparatus, Distance Measurement Method and Program
NEC CORPORATION
0 cites