Patents/Inventors

Akira Shimase

HamamatsuJP3 patents

4 Patents

US123477182025
Wafer Conveyance Unit and Wafer Conveyance Method
HAMAMATSU PHOTONICS K.K.
0 cites
US123405042025
Semiconductor Inspecting Method and Semiconductor Inspecting Device
HAMAMATSU PHOTONICS K.K.
0 cites
US122223872025
Semiconductor Device Inspection Method and Semiconductor Device Inspection Apparatus
HAMAMATSU PHOTONICS K.K.
0 cites
US115791842023
Analysis Method, Analysis Device, Analysis Program, and Recording Medium for Recording Analysis Program
HAMAMATSU PHOTONICS K.K.
0 cites