Patents/Inventors

Akira Noda

KyotoJP10 patents

9 Patents

US126132262026
Peak Area Display Device, Peak Area Display Method, Peak Area Calculation Device and Peak Area Calculation Method
SHIMADZU CORPORATION
0 cites
US125354712026
Waveform Information Inference Method and Device, and Peak Waveform Processing Method and Device
SHIMADZU CORPORATION
0 cites
US125304282026
Analysis Method and Diagnosis Assistance Method
SHIMADZU CORPORATION
0 cites
US122982852025
Sample Measurement Device and Measurement Parameter Setting Assistance Device
SHIMADZU CORPORATION
0 cites
US122924252025
Peak Tracking Device, Peak Tracking Method and Non-transitory Computer Readable Medium Storing Peak Tracking Program
SHIMADZU CORPORATION
0 cites
US120211602024
Semiconductor Wafer, Radiation Detection Element, Radiation Detector, and Production Method for Compound Semiconductor Monocrystalline Substrate
JX METALS CORPORATION
0 cites
US119676592024
Semiconductor Wafer, Radiation Detection Element, Radiation Detector, and Production Method for Compound Semiconductor Monocrystalline Substrate
JX METALS CORPORATION
0 cites
US119269242024
Indium Phosphide Substrate, Semiconductor Epitaxial Wafer, Method for Producing Indium Phosphide Single-crystal Ingot and Method for Producing Indium Phosphide Substrate
JX METALS CORPORATION
0 cites
US116817782023
Analysis Data Processing Method and Analysis Data Processing Device
SHIMADZU CORPORATION
0 cites