Patents/Inventors

Akira Masuya

TokyoJP8 patents

8 Patents

US123861492025
Calibration Sample, Manufacturing Method for Calibration Sample, and Calibration Method for Autofocus Target Position
HITACHI HIGH-TECH CORPORATION
0 cites
US121461312024
Testing Apparatus and Testing Method
HITACHI HIGH-TECH CORPORATION
0 cites
US121468222024
Particle Quantitative Measurement Device
Hitachi High-tech Corporation
0 cites
US120857042024
Microscopic Image Capturing Method and Microscopic Image Capturing Device
HITACHI HIGH-TECH CORPORATION
0 cites
US118927062024
Observation Device
HITACHI HIGH-TECH CORPORATION
0 cites
US116188732023
Culture Instrument
HITACHI HIGH-TECH CORPORATION
0 cites
US115783002023
Test Apparatus
Hitachi High-tech Corporation
0 cites
US115716982023
Bacterial Test Plate Having Antibacterial Agent Introduced Thereinto, and Transparent Plate
HITACHI HIGH-TECH CORPORATION
0 cites