Ajay Baranwal

7 Patents

• US123404952025

  Method for Computational Metrology and Inspection for Patterns to Be Manufactured on a Substrate

  D2S, Inc.

  0 cites
• US122875672025

  Method and System for Reticle Enhancement Technology

  D2S, Inc.

  0 cites
• US122880222025

  Methods and Systems for Generating Shape Data for Electronic Designs

  Center For Deep Learning In Electronics Manufacturing

  0 cites
• US120459962024

  Methods and Systems for Registering Images for Electronic Designs

  Center For Deep Learning In Electronics Mfg., Inc.

  0 cites
• US119214202024

  Method and System for Reticle Enhancement Technology

  D2S, Inc.

  0 cites
• US118474002023

  Methods and Systems for Generating Shape Data for Electronic Designs

  Center For Deep Learning In Electronics Manufacturing, Inc.

  0 cites
• US118234232023

  Methods and Systems for Compressing Shape Data for Electronic Designs

  Center For Deep Learning In Electronics Manufacturing, Inc.

  0 cites