Ailin Wang

5 Patents

• US122708302025

  Method for Achieving the Measuring Slip of Membrane Probes

  MAXONE SEMICONDUCTOR CO., Ltd.

  0 cites
• US122480042025

  Membrane Probe Card and Its Probe Head

  MAXONE SEMICONDUCTOR CO., Ltd.

  0 cites
• US122223692025

  MEMS Probe Card

  MAXONE SEMICONDUCTOR CO., Ltd.

  0 cites
• US121889622025

  Amplitude-modulating Probe Card and Its Probe and Amplitude-modulating Structure

  MAXONE SEMICONDUCTOR CO., Ltd.

  0 cites
• US121584812024

  Probe Card for Testing Power Devices Under High Temperature and High Voltage

  MAXONE SEMICONDUCTOR (SUZHOU) CO., Ltd.

  0 cites