3 Patents
- US120255012024Three-dimensional Displacement Compensation Method for Microscopic Thermoreflectance Thermography and Control Device
The 13Th Research Institute Of China Electronics Technology Group Corporation
0 cites - US119714512024Method for Determining Parameters in On-wafer Calibration Piece Model
The 13Th Research Institute Of China Electronics Technology Group Corporation
0 cites - US117332982023Two-port On-wafer Calibration Piece Circuit Model and Method for Determining Parameters
The 13Th Research Institute Of China Electronics Technology Group Corporation
0 cites