Patents/Inventors

Ahn Choi

SeoulKR1 patent

2 Patents

US122039802025
Wafer Level Methods of Testing Semiconductor Devices Using Internally-generated Test Enable Signals
Samsung Electronics Co., Ltd.
0 cites
US118677512024
Wafer Level Methods of Testing Semiconductor Devices Using Internally-generated Test Enable Signals
Samsung Electronics Co., Ltd.
0 cites