Patents/Inventors

Ahjin Jo

SeoulKR2 patents

3 Patents

US123991952025
Method for Measuring, by Measurement Device, Characteristics of Surface of Object to Be Measured, Atomic Force Microscope for Performing Same Method, and Computer Program Stored in Storage Medium to Perform Same Method
PARK SYSTEMS Corp.
0 cites
US120384552024
Measuring Method for Measuring Heat Distribution of Specific Space Using Sthm Probe, Method and Device for Detecting Beam Spot of Light Source
PARK SYSTEMS Corp.
0 cites
US115987882023
Measuring Method for Measuring Heat Distribution of Specific Space Using Sthm Probe, Method and Device for Detecting Beam Spot of Light Source
PARK SYSTEMS Corp.
0 cites