Abraham Slachter

6 Patents

• US123862682025

  Method for Calibrating Simulation Process Based on Defect-based Process Window

  ASML NETHERLANDS B.V.

  0 cites
• US123325732025

  Method for Determining Defectiveness of Pattern Based on After Development Image

  ASML Netherlands B.V.

  0 cites
• US121971362025

  Method of Determining Control Parameters of a Device Manufacturing Process

  ASML NETHERLANDS B.V.

  0 cites
• US120449802024

  Method of Manufacturing Devices

  ASML NETHERLANDS B.V.

  0 cites
• US118222552023

  Process Window Based on Defect Probability

  ASML Netherlands B.V.

  0 cites
• US117684422023

  Method of Determining Control Parameters of a Device Manufacturing Process

  ASML NETHERLANDS B.V.

  0 cites