Patents/Inventors

Abhishek Shendre

Fremont, CAUS5 patents

5 Patents

US125720822026
Geometric Loading Effect Correction for Lithography
D2S, Inc.
0 cites
US122437122025
Method and System for Determining a Charged Particle Beam Exposure for a Local Pattern Density
D2S, Inc.
0 cites
US118861662024
Method and System of Reducing Charged Particle Beam Write Time
D2S, Inc.
0 cites
US117567652023
Method and System for Determining a Charged Particle Beam Exposure for a Local Pattern Density
D2S, Inc.
0 cites
US116044512023
Method and System of Reducing Charged Particle Beam Write Time
D2S, Inc.
0 cites