11 Patents
- US125139742025Reduced Silicon Dislocation Defects from Deep SI Trench Integration
TEXAS INSTRUMENTS INCORPORATED
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- US123549042025Method of Reducing Integrated Deep Trench Optically Sensitive Defectivity
TEXAS INSTRUMENTS INCORPORATED
0 cites - US123241762025Implant Blocking for a Trench or Finfet Without an Additional Mask
Texas Instruments Incorporated
0 cites - US121703102024Integrated Circuits Including Composite Dielectric Layer
Texas Instruments Incorporated
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