Patents/Inventors

Aaron Rosenberg

Milpitas, CAUS1 patent

2 Patents

US117963902023
Bandgap Measurements of Patterned Film Stacks Using Spectroscopic Metrology
KLA Corporation
0 cites
US115730772023
Scatterometry Based Methods and Systems for Measurement of Strain in Semiconductor Structures
KLA Corporation
0 cites