Patents/Inventors

Aage Bendiksen

Fairfield, CTUS4 patents

5 Patents

US124427592025
Contaminant Analyzing Metrology System, Lithographic Apparatus, and Methods Thereof
ASML Netherlands B.V.
0 cites
US124052272025
Method for Region of Interest Processing for Reticle Particle Detection
ASML Holding N.V.
0 cites
US120667582024
Pellicle and Pellicle Assembly
ASML HOLDING N.V.
0 cites
US119069072024
Apparatus and Method for Determining a Condition Associated with a Pellicle
ASML HOLDING N.V.
0 cites
US118031192023
Contaminant Detection Metrology System, Lithographic Apparatus, and Methods Thereof
ASML Netherlands B.V.
0 cites