Patents/Assignees

Zing Semiconductor Corporation

8 patents in portfolio

US12474277utility2025
Method for Determining Types of Defects in Monocrystalline Silicon Wafer
0 cites
US12107016utility2024
Detection Method of Metal Impurity in Wafer
0 cites
US12046520utility2024
Method for Detecting Temperature of Thermal Chamber
0 cites
US12000060utility2024
Semiconductor Crystal Growth Method and Device
0 cites
US11923254utility2024
Method for Detecting Temperature of Thermal Chamber
0 cites
US11662326utility2023
Method for Calculating Liquid-solid Interface Morphology During Growth of Ingot
0 cites
US11624123utility2023
Method and Apparatus of Monocrystal Growth
0 cites
US11562917utility2023
Wafer Positioning Method and a Semiconductor Manufacturing Apparatus
0 cites