Patents/Assignees

TOKYO SEIMITSU CO., Ltd.

29 patents in portfolio

US12160663utility2024
Image Processing Device, Image Processing Method, and Three-dimensional Shape Measuring Device
0 cites
US12007413utility2024
Prober Controlling Device, Prober Controlling Method, and Prober
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US11964361utility2024
Workpiece Processing Device and Method
0 cites
US11940463utility2024
Particle Measurement Device, Three-dimensional Shape Measurement Device, Prober Device, Particle Measurement System, and Particle Measurement Method
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US11859969utility2024
Measurement Device
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US11740072utility2023
Inner Surface Shape Measurement Device, and Alignment Method and Magnification Calibration Method for Inner Surface Shape Measurement Device
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US11740074utility2023
Inner Surface Shape Measurement Device, and Alignment Method for Inner Surface Shape Measurement Device
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US11656068utility2023
Workpiece Diameter Measurement Method and Workpiece Circularity Measurement Machine
0 cites
US11571785utility2023
Workpiece Processing Device and Method
0 cites

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