- US11690228utility2023Annealed Seed Layer to Improve Ferroelectric Properties of Memory Layer0 cites
- US11688805utility2023Integrated Circuit Structure and Method for Forming the Same0 cites
- US11688804utility2023Semiconductor Device with Ring-shaped Doped Region and Manufacturing Method Thereof0 cites
- US11688606utility2023Tuning Threshold Voltage Through Meta Stable Plasma Treatment0 cites
- US11688607utility2023Slurry0 cites
- US11688625utility2023Method for Manufacturing Semiconductor Device0 cites
- US11687698utility2023Electromigration Evaluation Methodology with Consideration of Both Self-heating and Heat Sink Thermal Effects0 cites
- US11688639utility2023Semiconductor Device and Method0 cites
- US11688643utility2023Semiconductor Devices and Methods of Manufacturing Thereof0 cites
- US11688481utility2023Semiconductor Memory Devices with Diode-connected MOS0 cites
- US11688644utility2023Fin Isolation Structure for Finfet and Method of Forming the Same0 cites
- US11688645utility2023Structure and Formation Method of Semiconductor Device with Fin Structures0 cites
- US11688654utility2023Test Line Structure, Semiconductor Structure and Method for Forming Test Line Structure0 cites
- US11688703utility2023Methods of Fabricating Semiconductor Devices Having Conductive Pad Structures with Multi-barrier Films0 cites
- US11688708utility2023Chip Structure and Method for Forming the Same0 cites
- US11688717utility2023Mechanical Wafer Alignment Detection for Bonding Process0 cites
- US11688725utility2023Semiconductor Packages0 cites
- US11688728utility2023Integrated Circuit Structure and Method for Reducing Polymer Layer Delamination0 cites
- US11688730utility2023Method and System of Manufacturing Conductors and Semiconductor Device Which Includes Conductors0 cites